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951.
Guilin Wen Qing-Guo Wang Chong Lin Xu Han Guangyao Li 《Chaos, solitons, and fractals》2006,29(5):1142-1146
Synchronization under output feedback control with multiple random time delays is studied, using the paradigm in nonlinear physics—Chua’s circuit. Compared with other synchronization control methods, output feedback control with multiple random delay is superior for a realistic synchronization application to secure communications. Sufficient condition for global stability of delay-dependent synchronization is established based on the LMI technique. Numerical simulations fully support the analytical approach, in spite of the random delays. 相似文献
952.
Liquid crystal lens with focus movable in focal plane 总被引:1,自引:0,他引:1
A liquid crystal lens with focus movable in the focal plane is reported. There are three electrodes in the cell. One electrode with a hole in the center is divided into four subelectrodes. The potential of each subelectrode is adjusted to produce a desired asymmetrical phase transformation resulting in off-axis movement of the focus. The potential of another electrode is adjusted to maintain the focus in the focal plane. Movements of the focus in three directions in the focal plane are demonstrated experimentally, and off-axis movement as large as approximately 800 μm is realized. 相似文献
953.
应用深能级瞬态谱(DLTS)技术研究分子束外延(MBE)生长的highelectronmobilitytransistors(HEMT)和Pseudomorphichighelectronmobilitytransistors(PHEMT)结构深中心行为.样品的DLTS谱表明,在HEMT和PHEMT结构的nAlGaAs层里存在着较大浓度(1015-1017cm-3)和俘获截面(10-16cm2)的近禁带中部电子陷阱.它们可能与AlGaAs层的氧含量有关.同时还观察到PHEMT结构晶格不匹配的AlGaAsInGaAsGaAs系统在AlGaAs里产生的应力引起DX中心(与硅有关)能级位置的有序移动.其移动量可作为应力大小的一个判据,表明DLTS技术是定性识别此应力的可靠和简便的工具.
关键词:
分子束外延生长
高电子迁移率超高速微结构功能材料
深中心 相似文献
954.
A novel method of obtaining shearing interferogram by slightly moving the crystal in a photorefractive interferometer is proposed. This method can measure the phase of an object itself instead of its diffraction field, and it is easy to realize continuously changeable shearing distance in any lateral direction and introduce carrier fringes at the same time. Both the theoretical analysis and experimental verification are given. 相似文献
955.
956.
The main objects of study in this article are two classes of Rankin–Selberg L-functions, namely L(s,f×g) and L(s, sym2(g)× sym2(g)), where f,g are newforms, holomorphic or of Maass type, on the upper half plane, and sym2(g) denotes the symmetric square lift of g to GL(3). We prove that in general, i.e., when these L-functions are not divisible by L-functions of quadratic characters (such divisibility happening rarely), they do not admit any LandauSiegel zeros. Such zeros, which are real and close to s=1, are highly mysterious and are not expected to occur. There are corollaries of our result, one of them being a strong lower bound for special value at s=1, which is of interest both geometrically and analytically. One also gets this way a good bound onthe norm of sym2(g). 相似文献
957.
958.
Let (X, X
;
d} be a field of independent identically distributed real random variables, 0 < p < 2, and {a
,
; (
,
)
d ×
d,
≤
} a triangular array of real numbers, where
d is the d-dimensional lattice. Under the minimal condition that sup
,
|a
,
| < ∞, we show that |
|− 1/p ∑
≤
a
,
X
→ 0 a.s. as |
| → ∞ if and only if E(|X|p(L|X|)d − 1) < ∞ provided d ≥ 2. In the above, if 1 ≤ p < 2, the random variables are needed to be centered at the mean. By establishing a certain law of the logarithm, we show that the Law of the Iterated Logarithm fails for the weighted sums ∑
≤
a
,
X
under the conditions that EX = 0, EX2 < ∞, and E(X2(L|X|)d − 1/L2|X|) < ∞ for almost all bounded families {a
,
; (
,
)
d ×
d,
≤
of numbers. 相似文献
959.
960.
Songqing Zhao Yuzi Liu Shufang Wang Zhen Liu Ze Zhang Huibin Lu Bolin Cheng 《Applied Surface Science》2006,253(2):726-729
B-doped ZnO thin films have been fabricated on fused quartz substrates using boron-ZnO mosaic target by pulsed-laser deposition technique, and the mechanical properties have been studied by nanoindentation continuous stiffness measurement technique and transmission electron microscope (TEM). Nanoindentation measurement revealed that the hardness of B-doped ZnO films, 9.32 ± 0.90 to 12.10 ± 1.00 GPa, is much greater than that of undoped ZnO films and very close to that of traditional semiconductor Si. The mean transmittance (%) is larger than 81% in the visible range (380-780 nm) for all the films, and the Hall effect measurement showed that the carrier density is around 2 × 1020 cm−3 and the resistivity lower than 3 × 10−3 Ω cm. TEM characteristics show undoped thin films have more amorphous area between grains while the B-doped ZnO films have thin grain boundaries. We suggest that the grain boundaries act as the strain compensation sites and the decrease in thickness of grain boundaries enhances the hardness of the B-doped ZnO films. 相似文献